Field ToF-AMS Operation

The purpose of this page is to serve as a repository of best practices on how to calibrate, operate, and document the calibrations/operation of a ToF-AMS during a field study. Much of it will also be relevant for lab studies.

Once the data have been acquired, please refer to the ToF-AMS Field Data Analysis Guide to guide the (very complex) data analysis phase.

This page was created by the Jimenez Group at CU-Boulder

Stardard Set-up and Tuning Procedures

Tuning the Ion Source and ToF-MS

Note: these are some notes on tuning put together by P. DeCarlo and J.L. Jimenez, and circulated via email to Tofwerk and some core users. The responses that we got via email are inserted in the original list. There appear to be different schools of thought on how to tune, so these are given here only as guidelines.

• ORDER OF TUNING
  • Tune ion source first for signal, then tune reflectron voltages for resolution, then tune Pulsers for detailed peak shape

• ION SOURCE:
  • The tuning appears to depend on the emission current (maybe really filament current?) in a way that we don't understand. So it is important to tune at the emission current that will be used during measurements (typically 2 mA)
  • Don't change ion chamber from design values for that ToF by more than 10% (design values = 49V for cToF, 35V for vToF, and 8.5 for wToF, from Katrin's email on 3/1/2006)
  • In general we don't tune the ion chamber. Rather we tune the heater bias, which will typically be a few volts lower than the ion chamber value.
    • Response from Achim T: Tuning the ion chamber makes a lot of sense. It affects the ion signal a lot by a better extraction of the ions into the Pulser region. In the moment we have no evidence that changes in a certain range (not up to 80 V) will lead to a loss of small ions. The post acceleration affects this loss in a similar way like the ion chamber voltage. By increasing it the ions get a higher velocity perpendicular to the ion extraction. This has the opposite effect to increasing the ion chamber voltage.
  • The difference between the ion chamber and the filament should be 70 V (this is the electron energy)
    • Response from Katrin F: This is somewhat flexible, since depending on where you set your extraction lens voltage you may have a range of potentials in the ion source (due to field penetration). The problem is that what you see on the tof detector will be a folding of the Energy acceptance of the TOF (which is on maximum at the 49eV for the C etc) And the energy distribution of the ions transferred in the TOF extraction. Depending on your LV settings you will get ions of different energies into the TOF extraction. To be sure that you have preferentially 70eV ions one would need to compare to a reference spectrum, and tune the LV until you reproduce the reference spectrum. In principle you should be fine if you use the same voltages relative to the ion source as with the quad settings (what voltages did you use there to get the 70eV reference spectra?) for filament, ion chamber, and extraction lens.
  • The ion energy into the ToF orthogonal extractor is determined by the ion chamber. Changing the ion energy will change the m/z-dependence of the extraction efficiency. This should not be changed during a campaign.
  • Deflector flange needs to walk with the deflector voltage, small changes between the two are okay, and fractional volts can help a lot
  • Electron Pusher is not connected and is disabled in recent TPS software versions.

• HIGH VOLTAGE:
  • Tune reflectron grid and backplane together. This is the best way to increase resolution.
    • Response from Katrin F: Just tuning RG is sufficient.
  • Lens: this was added to tune off V-mode ions in W-mode. It should be high (~2800 V) in W mode and low (~1000) in V-mode
    • Response from Achim T: Tuning the lens voltage helps a lot by reducing the vmode ions in W mode and by increasing the signal. The quoted numbers of 1000 V for Vmode and 2800 V for Wmade are typical but they vary a lot. There are instruments which have the best vmode performance with a lense voltage of 2300 V.
  • MCP and post-acceleration are NOT tuned, these are set for amplification depending on other considerations (saturation, signal-to-noise, etc.)
  • Hardmirror doesn't have much effect on signal or resolution, no need to tune much
    • Response from Katrin F: Yes, hardmirror should NOT be tuned
    • Response from Achim T: The hardmirror has an effect on the peak shape and signal height. But you may have to vary it by some hundred Volts. In a well tuned instrument it has really no effect.

• PULSERS
  • The three should be tuned together
    • Response from Katrin F: I would prefer in the future that the pulser is left at the settings I ship it. You can get the same effects by just tuning the LV.
  • These should NOT be set higher than 800V
  • Tuning these 3 together is the best way to tune out leading and tailing edges
  • U+Low is not connected and doesn't do anything

Standard Field Calibration procedures

Make sure you are doing data acquisition with the latest version of Acquisition software whether a ToF or a Quad. GIVE Website (upgrade before field campaign, and check for any problems) ToF-AMS Software: http://cires.colorado.edu/jimenez-group/ToFAMSResources/ToFSoftware/index.html Quad-AMS Software: http://cires.colorado.edu/jimenez-group/QAMSResources/Software/index.html#Acq

Saving Frequency: at least 5 min data on fixed time grid (on the hour).

Mass Range: at least up to 0-300 amu (Q). One should go higher with the ToF instruments around 10-500 is encouraged.

For Q-AMS Particle TOF data the following masses should be used at a minimum: 16, 28, 30, 35, 43, 44, 46, 48, 55, 57, 60, 64

For Q-AMS Jump mass spec mode can be used, but it is not necessary for ground based monitoring unless mass concentrations are very low (remote clean sites).

Oven temperature: 600C is standard.

If you have the ability to dry the aerosol inlet, do that. At the very least a measure of the RH at the AMS inlet is needed if the inlet line is not dried.

Calibration	Frequency	Description
Inline HEPA Filter	At least every 3 days, best to do every day at the site. Also do this every time the instrument has been vented/pumped down.	30 minute (if every 3 days) or 10 min (every day) HEPA filtered, particle free air from inlet. Do not filter at the same time every day. See suggested schedule below. HEPA should be put on inlet outside (if possible) and this will allow a check for leaks in the inlet system, use a CPC. Note that there is an Inlet delay, so one should reinitialize (F5) AMS acquisition after the inlet residence time has elapsed so that the data files are not mixed filter/ambient data
IE calibration	Every Week (minimum) 2x a week better, and anytime the instrument has been pumped down, or there has been a problem. Specifically for a filament and/or MCP/electron multiplier change	Standard Ammonium Nitrate IE calibration.
Baseline / SI calibration	Before every IE calibration	See Instructions for Bitwise below
Size Calibration	Do at beginning and end of Campaign, and if there is a large instrument problem (e.g. loss of a pump etc.)	Standard AMS size calibration Note that size calibration changes if lens pressure changes. So if you change the orifice and the lens P changes more than 3%, you should do another size cal. (changes in P are amplified into larger changes in size)
Clock Synchonization		Computer clocks can drift by up to 1 min per day (occasionally worse). Either set up automatically or keep track of instrument clock in relation to other clocks.

Suggested Filter Times (perform the filter blank during the time interval indicated):

Day of week	Week 1	Week 2	Week 3	Week 4	Week 5
Monday	800-900	1000-1100	1200-1300	1400-1500	1600-1700
Tuesday	1100-1200	1300-1400	1500-1600	1700-1800	900-1000
Wednesday	1200-1300	1400-1500	1600-1700	800-900	1000-1100
Thursday	1500-1600	1700-1800	900-1000	1100-1200	1300-1400
Friday	1600-1700	800-900	1000-1100	1200-1300	1400-1500
Saturday	900-1000	1100-1200	1300-1400	1500-1600	1700-1800
Sunday	1200-1300	1400-1500	1600-1700	800-900	1000-1100

Calibrations

• BitWise

Instructions for use of BitWise

• Lens Alignment
• IE Calibration
• Size Calibration